Abstract
The properties of polycrystalline materials are often dominated by defects; two-dimensional (2D) crystals can even be divided and disrupted by a line defect1,2,3. However, 2D crystals are often required to be processed into films, which are inevitably polycrystalline and contain numerous grain boundaries, and therefore are brittle and fragile, hindering application in flexible electronics, optoelectronics and separation1,2,3,4. Moreover, similar to glass, wood and plastics, they suffer from trade-off effects between mechanical strength and toughness5,6. Here we report a method to produce highly strong, tough and elastic films of an emerging class of 2D crystals: 2D covalent organic frameworks (COFs) composed of single-crystal domains connected by an interwoven grain boundary on water surface using an aliphatic bi-amine as a sacrificial go-between. Films of two 2D COFs have been demonstrated, which show Young’s moduli and breaking strengths of 56.7 ± 7.4 GPa and 73.4 ± 11.6 GPa, and 82.2 ± 9.1 N m−1 and 29.5 ± 7.2 N m−1, respectively. We predict that the sacrificial go-between guided synthesis method and the interwoven grain boundary will inspire grain boundary engineering of various polycrystalline materials, endowing them with new properties, enhancing their current applications and paving the way for new applications.
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All data supporting the findings of this study are available in the paper and its Supplementary Information. Source data are provided with this paper.
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Acknowledgements
We thank the National Natural Science Foundation of China (52061135103, 51873236) and Fundamental Research Funds for the Central Universities, Sun Yat-sen University (No. 23yxqntd002), for financial support. Structure characterizations were supported by the Instrumental Analysis and Research Center of Sun Yat-sen University. We acknowledge the ESRF for provision of synchrotron radiation facilities and we would like to thank O. Konovalov for assistance and support in using beamline ID10. Parts of these experiments were performed at the BL11 – NCD-SWEET beamline at ALBA Synchrotron with the collaboration of ALBA staff. We would like to thank M. Malfois for help with setting up the experiment. We acknowledge SOLEIL for provision of synchrotron radiation facilities and we would like to thank A. Hemmerle for assistance in using beamline SIRIUS.
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Z. Zheng initiated the project. Z. Zheng and W.L. coordinated the research. Z. Zheng and Yonghang Yang designed the experiments. Yonghang Yang and Z.L. performed most of the experimental work. X.D., J.L. and C.L. conducted the TEM tests. B.L., H.Q. and U.K. carried out AC-HRTEM and selected area electron diffraction. J.K., Yang Yang and A.G. conducted mechanical tests and analysis. M.H. and S.C.B.M. performed GIWAXS measurements and analysis. L.G., Z.L., D.L. and Z. Zhou conducted the AFM test and analysis. S.H. and X.Z. performed DFT simulations. C.W. helped with discussion. Z. Zheng, Yonghang Yang and W.L. wrote the manuscript. All authors contributed to the proofreading of the manuscript.
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Extended data figures and tables
Extended Data Fig. 1 Macroscopic 2DCOF-1 film.
a, Photograph of 2DCOF-1 films grown on the water surface of a petri dish with a diameter of 60 mm. b, c, Photographic (b) and optical microscopic (c) image of 2DCOF-1 film deposited onto a silicon substrate with a layer of 300 nm thick silicon dioxide. The position indicated by the arrow in (b) is where the tweezers caught the silicon substrate during the deposition of the film. The substrate allows angstrom level thickness detection by the eyes due to false color change. The homogeneous color of the film indicates its homogeneity in thickness. d, Photographic image of bended 2DCOF-1 film deposited onto Nafion film. The position indicated by the arrow is the bare Nafion film.
Extended Data Fig. 2 Crystallinity and structure of 2DCOF-1 film.
a, TEM image of 2DCOF-1 film suspended over holey copper grids. Selected area electron diffraction patterns at different areas ((c), (d), (e), (f)) indicated the single crystallinity of the 2DCOF-1 film. f, Near-atomic structure of 2DCOF-1 film visualized by AC-HRTEM. Inset, corresponding Fast Fourier transform pattern.
Extended Data Fig. 3 Reaction time dependent GIWAXS images of 2DCOF-1 film.
GIWAXS images of 2DCOF-1 films deposited onto silicon squares with a diameter of 1.5 cm at synthesis times of (a) 6 h, (b) 7 h, (c) 16 h, and (d) 6 days.
Extended Data Fig. 4 Reaction time dependent AC-HRTEM images of 2DCOF-1 film.
AC-HRTEM images of 2DCOF-1 films deposited onto holey copper grids at synthesis times of (a) 6 to 8 h (the inset shows a selected area electron diffraction pattern of the film), (b) 14 h, (c) 16 h, (d) 2 days, (e) 6 days, and (f) 7 days.
Extended Data Fig. 5 Reaction time dependent AFM images of 2DCOF-1 film.
AFM topographic images of 2DCOF-1 films on mica with synthesis times of (a) 6 to 8 h, (b) 9 h, (c) 10 h, (d) 12 h, (e) 14 h, (f) 16 h, (g) 2 days, (h) 6 days, and (i) 7 days.
Extended Data Fig. 6 Morphology and structure 2DCOF-1-A film.
a, Photographic image of the film on water surface of a petri dish with a diameter of 60 mm. b, GIWAXS patterns of 2DCOF-1-A film with a synthesis time of 7 days on silicon substrate. c, AFM topographic image of the film on mica (upper) and its corresponding roughness at the white dashed line. d, Scanning electron microscopic image of the 2DCOF-1-A film over 47-µm-diameter-sized circular hole in a copper grid. e, Wiener filtered AC-HRTEM image of the grain boundary structure of the film. f, Optical image of the 2DCOF-1-A film over 47-µm-diameter-sized circular holes in a copper grid.
Extended Data Fig. 7 Morphology of 2DCOF-2 film.
a, Photograph of the film grown on the water surface of a petri dish with a diameter of 60 mm. b, Optical microscopic image of the film deposited onto a silicon substrate with a layer of 300 nm thick silicon dioxide. c, AFM topographic image of the film on mica. d, Scanning electron microscopy image of the 2DCOF-2 film suspended over 47-µm-diameter-sized circular hole in a copper grid. e, Scanning electron microscopic image of the 2DCOF-2 film at higher magnification.
Extended Data Fig. 8 Morphology of 2DCOF-2 film.
a, GIWAXS patterns of 2DCOF-2 film on silicon substrate. b, Near-atomic structure of 2DCOF-2 film visualized by AC-HRTEM. Inset shows the corresponding Fast Fourier transform pattern. c, AFM topographic image of 2DCOF-2 on mica and d, corresponding height profile along the white line in (c).
Extended Data Fig. 9 Bulge test of 2DCOF-1 film.
a, Optical images of film bulging under different pressures. b, The load and unload curves and their fitted curves. AFM image of the 2DCOF-1 film at a deflection of 2.6 µm (inset).
Extended Data Fig. 10 Mechanical properties of 2DCOF-2 film.
a, Force-displacement curves of 20 cycles of loading (upper) and unloading of AFM tips with a radius of ~ 100 nm at the same position under constant rate. b, Rupture force-displacement curves of 2DCOF-2 film at the same indentation position as in (a).
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Yang, Y., Liang, B., Kreie, J. et al. Elastic films of single-crystal two-dimensional covalent organic frameworks. Nature 630, 878–883 (2024). https://doi.org/10.1038/s41586-024-07505-x
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DOI: https://doi.org/10.1038/s41586-024-07505-x
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