Extended Data Fig. 4: EDS line scan results showing the stoichiometry of the filament. | Nature

Extended Data Fig. 4: EDS line scan results showing the stoichiometry of the filament.

From: Phase-change memory via a phase-changeable self-confined nano-filament

Extended Data Fig. 4

a. The TEM HAADF image showing the direction of the EDS line scan (yellow arrow). b. Results of the EDS line scan demonstrating the overall stoichiometry of the filament is approximately 25.1% Si and 74.9% Te (~SiTe3), while the non-filamentary region is composed of about 100% Si.

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