Extended Data Fig. 3: Energy-dispersive spectroscopy (EDS) mapping results of the aggressively formed NFPCM.
From: Phase-change memory via a phase-changeable self-confined nano-filament
a. Cross-sectional TEM HAADF image of the NFPCM with the aggressive forming (see Methods). b. EDS mapping results showing the Te atoms are injected into the a-Si layer, forming the SiTex filament.